Surface Phenomena During Plasma-Assisted Atomic Layer Etching of SiO 2
Gasvoda, Ryan James, van de Steeg, Alex W., Bhowmick, Ranadeep, Hudson, Eric A, Agarwal, SumitLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.7b08234
Date:
August, 2017
File:
PDF, 2.68 MB
english, 2017