[IEEE 2017 29th Chinese Control And Decision Conference...

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[IEEE 2017 29th Chinese Control And Decision Conference (CCDC) - Chongqing, China (2017.5.28-2017.5.30)] 2017 29th Chinese Control And Decision Conference (CCDC) - Dynamic inclination measurement at-bit based on MEMS accelerometer

Yuntao, Sun, Qingyun, Di, Wenxiu, Zhang, Wenxuan, Chen, Yongyou, Yang, Jian, Zheng
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Year:
2017
Language:
english
DOI:
10.1109/ccdc.2017.7979384
File:
PDF, 468 KB
english, 2017
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