[IEEE 2017 29th Chinese Control And Decision Conference (CCDC) - Chongqing, China (2017.5.28-2017.5.30)] 2017 29th Chinese Control And Decision Conference (CCDC) - Dynamic inclination measurement at-bit based on MEMS accelerometer
Yuntao, Sun, Qingyun, Di, Wenxiu, Zhang, Wenxuan, Chen, Yongyou, Yang, Jian, ZhengYear:
2017
Language:
english
DOI:
10.1109/ccdc.2017.7979384
File:
PDF, 468 KB
english, 2017