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Point and Extended Defects in Ultra Wide Band Gap β-Ga2O3 Interfaces
Johnson, Jared M, Krishnamoorthy, Sriram, Rajan, Siddharth, Hwang, JinwooVolume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927617007930
Date:
July, 2017
File:
PDF, 796 KB
english, 2017