Cyclic Voltammetry Measurement for Cu 2...

IOP Conference Series Materials Science and Engineering 2017 / 08 Vol. 226

Cyclic Voltammetry Measurement for Cu 2 O Based Homostructure Thin Film

Arifin, Nurliyana Binti Mohamad, Mohamad, Fariza Binti, Anuar, Nur Fathiah Binti Sikh, Ahmad, Nabihah Binti, Nor, Nik Hisyamudin Muhd, Izaki, Masanobu
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Volume:
226
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/226/1/012184
Date:
August, 2017
File:
PDF, 1.53 MB
english, 2017
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