Itô-SDE MCMC method for Bayesian characterization of errors...

Itô-SDE MCMC method for Bayesian characterization of errors associated with data limitations in stochastic expansion methods for uncertainty quantification

Arnst, M., Abello Álvarez, B., Ponthot, J.-P., Boman, R.
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Volume:
349
Language:
english
Journal:
Journal of Computational Physics
DOI:
10.1016/j.jcp.2017.08.005
Date:
November, 2017
File:
PDF, 1.65 MB
english, 2017
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