![](/img/cover-not-exists.png)
[IEEE 2016 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2016.10.18-2016.10.20)] 2016 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Developing a retrieval based diagnostic aid for automated melanoma recognition of dermoscopic images
Rahman, Mahmudur, Alpaslan, Nuh, Bhattacharya, PrabirYear:
2016
Language:
english
DOI:
10.1109/AIPR.2016.8010594
File:
PDF, 620 KB
english, 2016