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[IEEE 2017 International Conference on Information and Digital Technologies (IDT) - Zilina, Slovakia (2017.7.5-2017.7.7)] 2017 International Conference on Information and Digital Technologies (IDT) - Simulation of conducted EMI in SiC MOSFET buck converters before and after aging

Douzi, Shawki, Tlig, Mohamed, Slama, Jaleleddine Ben Hadj, Kadi, Moncef
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Year:
2017
Language:
english
DOI:
10.1109/DT.2017.8012095
File:
PDF, 468 KB
english, 2017
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