Characterization of TiN back contact interlayers with varied thickness for Cu 2 ZnSn(S,Se) 4 thin film solar cells
Englund, Sven, Paneta, Valentina, Primetzhofer, Daniel, Ren, Yi, Donzel-Gargand, Olivier, Larsen, Jes, Scragg, Jonathan, Björkman, Charlotte PlatzerLanguage:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2017.08.030
Date:
August, 2017
File:
PDF, 1.12 MB
english, 2017