Characterization of irradiated nails in terms of...

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Frontiers of Optoelectronics 2017 / 8

Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions

Savenkov, Sergey, Priezzhev, Alexander V., Oberemok, Yevgen, Sholom, Sergey, Kolomiets, Ivan
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Language:
english
Journal:
Frontiers of Optoelectronics
DOI:
10.1007/s12200-017-0727-3
Date:
August, 2017
File:
PDF, 953 KB
english, 2017
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