Nano-metrology: The art of measuring X-ray mirrors with...

Review of Scientific Instruments 2016 / 05 Vol. 87; Iss. 5

Nano-metrology: The art of measuring X-ray mirrors with slope errors

Alcock, Simon G., Nistea, Ioana, Sawhney, Kawal
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Volume:
87
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4949272
Date:
May, 2016
File:
PDF, 9.18 MB
english, 2016
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