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[ACM Press the 22nd ACM SIGKDD International Conference - San Francisco, California, USA (2016.08.13-2016.08.17)] Proceedings of the 22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining - KDD '16 - Revisiting Random Binning Features
Wu, Lingfei, Yen, Ian E.H., Chen, Jie, Yan, RuiYear:
2016
Language:
english
DOI:
10.1145/2939672.2939794
File:
PDF, 1.27 MB
english, 2016