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Characterization of Few layer Tungsten diselenide based FET under Thermal Excitation
Bandyopadhyay, Avra S, Saenz, Gustavo A., Kaul, AnupamaLanguage:
english
Journal:
MRS Advances
DOI:
10.1557/adv.2017.490
Date:
July, 2017
File:
PDF, 1.11 MB
english, 2017