Lid-Integral Cold-Plate Topology: Integration, Performance, and Reliability
Schlottig, Gerd, de Fazio, Marco, Escher, Werner, Granatieri, Paola, Khanna, Vijayeshwar D., Brunschwiler, ThomasVolume:
138
Language:
english
Journal:
Journal of Electronic Packaging
DOI:
10.1115/1.4032493
Date:
March, 2016
File:
PDF, 1.88 MB
english, 2016