FTIR Ellipsometry Study on RF sputtered Permalloy-Oxide...

MRS Advances 2016 Vol. 1; Iss. 49

FTIR Ellipsometry Study on RF sputtered Permalloy-Oxide Thin Films

Talukder, Md Abdul Ahad, Cui, Yubo, Compton, Maclyn, Geerts, Wilhelmus, Scolfaro, Luisa, Zollner, Stefan
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Volume:
1
Year:
2016
Language:
english
Journal:
MRS Advances
DOI:
10.1557/adv.2016.427
File:
PDF, 260 KB
english, 2016
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