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Conductive Atomic Force Microscopy (Applications in Nanomaterials) || Design and Fabrication of a Logarithmic Amplifier for Scanning Probe Microscopes to Allow Wide-Range Current Measurements
Lanza, MarioVolume:
10.1002/97
Year:
2017
Language:
english
DOI:
10.1002/9783527699773.ch11
File:
PDF, 1.25 MB
english, 2017