Conductive Atomic Force Microscopy (Applications in Nanomaterials) || KPFM and its Use to Characterize the CPD in Different Materials
Lanza, MarioVolume:
10.1002/97
Year:
2017
Language:
english
DOI:
10.1002/9783527699773.ch14
File:
PDF, 855 KB
english, 2017