![](/img/cover-not-exists.png)
Conductive Atomic Force Microscopy (Applications in Nanomaterials) || Fabrication and Reliability of Conductive AFM Probes
Lanza, MarioVolume:
10.1002/97
Year:
2017
Language:
english
DOI:
10.1002/9783527699773.ch2
File:
PDF, 1.25 MB
english, 2017