Conductive Atomic Force Microscopy (Applications in Nanomaterials) || CAFM Studies on Individual GeSi Quantum Dots and Quantum Rings
Lanza, MarioVolume:
10.1002/97
Year:
2017
Language:
english
DOI:
10.1002/9783527699773.ch6
File:
PDF, 1.37 MB
english, 2017