Extraction of dynamic avalanche during IGBT turn off

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Microelectronics Reliability 2017 / 8

Extraction of dynamic avalanche during IGBT turn off

Geissmann, Silvan, Michielis, L. De, Corvasce, Ch., Rahimo, M., Andenna, M.
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.08.008
Date:
August, 2017
File:
PDF, 1.70 MB
english, 2017
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