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High Resolution TEM Observation of Nanocrystalline Silicon Fabricated by High Pressure Torsion (HPT)
Fukushima, Yuta, Edalati, Kaveh, Ikoma, Yoshifumi, Horita, Zenji, Smith, David J.Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615009691
Date:
August, 2015
File:
PDF, 629 KB
english, 2015