[AIP Sixth international conference on x-ray microscopy (XRM99) - Berkeley, California (USA) (2-6 Aug 1999)] AIP Conference Proceedings - X-ray speckle correlation interferometer
Eisenhower, RachelVolume:
507
Year:
2000
Language:
english
DOI:
10.1063/1.1291196
File:
PDF, 1.06 MB
english, 2000