[AIP Sixth international conference on x-ray microscopy...

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[AIP Sixth international conference on x-ray microscopy (XRM99) - Berkeley, California (USA) (2-6 Aug 1999)] AIP Conference Proceedings - X-ray speckle correlation interferometer

Eisenhower, Rachel
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Volume:
507
Year:
2000
Language:
english
DOI:
10.1063/1.1291196
File:
PDF, 1.06 MB
english, 2000
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