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[ECS 211th ECS Meeting - Chicago, Illinois (May 6-May 10, 2007)] ECS Transactions - Modeling and Characterization of Negative Bias Temperature Instability in p-Channel MOSFETs
Yang, J. B., Chen, Tupei, Tan, S. S., Ng, C. M., Chan, L.Volume:
6
Year:
2007
Language:
english
DOI:
10.1149/1.2728802
File:
PDF, 448 KB
english, 2007