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Investigation of optical characteristics of the evaporated Ta 2 O 5 thin films based on ellipsometry and spectroscopy
Prachachet, R., Buranasiri, P., Horprathum, M., Eiamchai, P., S.Limwichean,, patthanasettakul, V., N.Nuntawong,, Chindaudom, P., Samransuksamer, B., Lertvanithphol, T.Volume:
4
Year:
2017
Language:
english
Journal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2017.06.140
File:
PDF, 624 KB
english, 2017