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Determination of Reliable Grain Boundary Orientation using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope
Zhang, Xinming, Rufner, Jorgen F., LaGrange, Thomas, Castro, Ricardo H.R., Schoenung, Julie M., Campell, Geoffrey H., van Benthem, KlausVolume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927615009095
Date:
August, 2015
File:
PDF, 98 KB
english, 2015