Side-by-Side Comparison of Single- and Dual-Active Layer...

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IEEE Transactions on Electron Devices 2017

Side-by-Side Comparison of Single- and Dual-Active Layer Oxide TFTs: Experiment and TCAD Simulation

Stewart, Kevin A., Gouliouk, Vasily, McGlone, John M., Wager, John F.
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2743062
File:
PDF, 1.28 MB
english, 2017
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