Analysis of multifinger power HEMTs supported by effective...

Microelectronics Reliability 2017 / 11 Vol. 78

Analysis of multifinger power HEMTs supported by effective 3-D device electrothermal simulation

Chvála, Aleš, Marek, Juraj, Príbytný, Patrik, Šatka, Alexander, Stoffels, Steve, Posthuma, Niels, Decoutere, Stefaan, Donoval, Daniel
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Volume:
78
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.08.012
Date:
November, 2017
File:
PDF, 3.09 MB
english, 2017
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