![](/img/cover-not-exists.png)
Determination of band offsets between p-NiO gate electrode and unintentionally doped GaN for normally-off GaN power device
Li, Liuan, Wang, Wenjing, He, Liang, Zhang, Xiaorong, Wu, Zhisheng, Liu, YangLanguage:
english
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2017.09.037
Date:
September, 2017
File:
PDF, 946 KB
english, 2017