Time-of-flight mass spectrometry depth profiling of...

Surface and Interface Analysis 2017 / 10 Vol. 49; Iss. 10

Time-of-flight mass spectrometry depth profiling of sodium-implanted polyethylene terephthalate

Kudriavtsev, Yu, Hernández, A.G., Asomoza, R., Korol, V.M.
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Volume:
49
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6264
Date:
October, 2017
File:
PDF, 720 KB
english, 2017
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