Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors
de Oliveira Rocha, Raphael, Sill Torres, Frank, Bastos, Rodrigo PossamaiVolume:
78
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.08.015
Date:
November, 2017
File:
PDF, 1.09 MB
english, 2017