AIP Conference Proceedings [AIP THE 10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY - Chicago, Illinois, (USA) (15–20 August 2010)] - Present and Future X-ray Tomographic Microscopy at TOMCAT
Marone, F., Mokso, R., Modregger, P., Fife, J., Pinzer, B., Thüring, T., Mader, K., Mikuljan, G., Isenegger, A., Stampanoni, M., McNulty, Ian, Eyberger, Catherine, Lai, BarryYear:
2011
Language:
english
DOI:
10.1063/1.3625318
File:
PDF, 1.87 MB
english, 2011
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