Influence of constant current stress on the conduction mechanisms of reverse leakage current in UV-A light emitting diodes
Wang, Ying-zhe, Zheng, Xue-Feng, Dai, Feng, Zhu, Jia-duo, Li, Pei-Xian, Ma, Xiao-Hua, Hao, YueLanguage:
english
Journal:
Superlattices and Microstructures
DOI:
10.1016/j.spmi.2017.09.015
Date:
September, 2017
File:
PDF, 882 KB
english, 2017