[IEEE 2017 IEEE Conference on Computer Vision and Pattern...

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[IEEE 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Honolulu, HI, USA (2017.7.21-2017.7.26)] 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Efficient Image Set Classification Using Linear Regression Based Image Reconstruction

Shah, Syed A. A., Nadeem, Uzair, Bennamoun, Mohammed, Sohel, Ferdous, Togneri, Roberto
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Year:
2017
Language:
english
DOI:
10.1109/CVPRW.2017.88
File:
PDF, 323 KB
english, 2017
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