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Investigation on the Conduction Mechanisms in Metal-Base Vertical Organic Transistors by DC and LF-Noise Measurements
Giusi, G., Sarnelli, E., Barra, M., Cassinese, A., Scandurra, G., Nakayama, K., Ciofi, C.Year:
2017
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2738699
File:
PDF, 1.20 MB
english, 2017