Spectroscopic ellipsometry characterization of Ge 30-x Sb x...

Optik - International Journal for Light and Electron Optics 2017 / 10 Vol. 147

Spectroscopic ellipsometry characterization of Ge 30-x Sb x Se 70 films using combinations of multiple dispersion functions

Abdel-Wahab, F., Badawi, A., Alatibi, M.S., Alomairy, S.E., Ali karar, N.N., Ashraf, I.M., Ahmed, E.M.
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Volume:
147
Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2017.08.054
Date:
October, 2017
File:
PDF, 3.12 MB
english, 2017
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