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Investigation of the in-plane and out-of-plane electrical properties of metallic nanoparticles in dielectric matrix thin films elaborated by atomic layer deposition
THOMAS, Daniel, Puyoo, Etienne, Le Berre, Martine, Militaru, Liviu, Koneti, Siddardha, Malchere, Annie, Epicier, Thierry, Roiban, Lucian, Albertini, David, Sabac, Andrei, Calmon, FrancisLanguage:
english
Journal:
Nanotechnology
DOI:
10.1088/1361-6528/aa8b5e
Date:
September, 2017
File:
PDF, 5.44 MB
english, 2017