[IEEE 2017 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) - Copenhagen, Denmark (2017.7.24-2017.7.28)] 2017 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) - Effect of acceptor concentration on the dark current characteristics for GaAs-based blocked impurity band (BIB) terahertz detectors

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