Degradation Behavior of 850 nm AlGaAs/GaAs Oxide VCSELs Suffered from Electrostatic Discharge
Kim, Taeyong, Kim, Taeki, Kim, Sangin, Kim, Sang-BaeVolume:
30
Language:
english
Journal:
ETRI Journal
DOI:
10.4218/etrij.08.0108.0148
Date:
December, 2008
File:
PDF, 844 KB
english, 2008