Degradation Behavior of 850 nm AlGaAs/GaAs Oxide VCSELs...

Degradation Behavior of 850 nm AlGaAs/GaAs Oxide VCSELs Suffered from Electrostatic Discharge

Kim, Taeyong, Kim, Taeki, Kim, Sangin, Kim, Sang-Bae
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Volume:
30
Language:
english
Journal:
ETRI Journal
DOI:
10.4218/etrij.08.0108.0148
Date:
December, 2008
File:
PDF, 844 KB
english, 2008
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