Battery remaining useful life prediction at different...

Microelectronics Reliability 2017 / 11 Vol. 78

Battery remaining useful life prediction at different discharge rates

Wang, Dong, Yang, Fangfang, Zhao, Yang, Tsui, Kwok-Leung
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Volume:
78
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.09.009
Date:
November, 2017
File:
PDF, 2.67 MB
english, 2017
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