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Pattern Overlap and High Resolution Electron Backscatter Diffraction
Tong, Vivian, Jiang, Jun, Wilkinson, Angus, Britton, BenVolume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615011009
Date:
August, 2015
File:
PDF, 272 KB
english, 2015