Independence of the scattering process at the surface of...

Journal of Materials Science Letters 1987 / 05 Vol. 6; Iss. 5

Independence of the scattering process at the surface of thin metal film in the framework of the multidimensional conduction models

H. Tijani, C. R. Pichard, A. J. Tosser
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Volume:
6
Language:
english
Pages:
4
DOI:
10.1007/bf01739282
Date:
May, 1987
File:
PDF, 329 KB
english, 1987
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