A Comparative Study of InGaP/GaAs Collector-Up HBTs for High-Reliability Small-Scale PA Applications
Su, Jer-Lin, Tseng, Hsien-ChengYear:
2017
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2017.2753261
File:
PDF, 333 KB
english, 2017