Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors
Ohta, Taisuke, Berg, Morgann, Keyshar, Kunttal, Kephart, Jason M., Beechem, Thomas E., Vajtai, Robert, Ajayan, Pulickel, Mohite, Aditya D., Sampath, Walajabad S., Chan, CalvinVolume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617008182
Date:
July, 2017
File:
PDF, 204 KB
english, 2017