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Charge pumping test technique using CMOS ring oscillator on leakage issue
Liu, Yongbo, Zhu, Zhengyong, Zhu, Huilong, Wan, Guangxing, Li, Junfeng, Zhao, ChaoVolume:
68
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2017.08.009
Date:
October, 2017
File:
PDF, 600 KB
english, 2017