Effect of body bias and temperature on low-frequency noise in 40-nm nMOSFETs
Chiu, Hsien-Chin, Chou, Min-Li, Cheng, Chun-Hu, Kao, Hsuan-Ling, Cho, Cheng-LinVolume:
78
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.09.002
Date:
November, 2017
File:
PDF, 1.02 MB
english, 2017