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Structural and Electronic Properties of Ti Doped ZnO: XRD, TEM, EELS and Ab-initio Simulations
Rostislav, Medlin, Jan, Minar, Pavol, Sutta, Wilayat, Khan, Ondrej, Sipr, Petr, Novak, Marie, NetrvalovaVolume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927617009096
Date:
July, 2017
File:
PDF, 458 KB
english, 2017