Combined frequency modulated atomic force microscopy and...

Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications

Morawski, Ireneusz, Spiegelberg, Richard, Korte, Stefan, Voigtländer, Bert
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
86
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4936975
Date:
December, 2015
File:
PDF, 3.09 MB
english, 2015
Conversion to is in progress
Conversion to is failed