Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications
Morawski, Ireneusz, Spiegelberg, Richard, Korte, Stefan, Voigtländer, BertVolume:
86
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4936975
Date:
December, 2015
File:
PDF, 3.09 MB
english, 2015