[WORLD SCIENTIFIC The 2015 International Conference on...

  • Main
  • [WORLD SCIENTIFIC The 2015...

[WORLD SCIENTIFIC The 2015 International Conference on Applied Mechanics, Mechatronics and Intelligent Systems (AMMIS2015) - Nanjing, China (19 – 20 June 2015)] Applied Mechanics, Mechatronics and Intelligent Systems - A Novel Symmetric Test Structure for Residual Stress on MEMS Thin Film

Tu, Chenfeng, Zhou, Zai-fa, Xu, Yanbo
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
DOI:
10.1142/9789814733878_0008
File:
PDF, 327 KB
english
Conversion to is in progress
Conversion to is failed