Development of a Compact Diagnostic System for Monitoring Hard X-Rays
Lee, Y. S., Nam, U. W., England, A. C., Chen, Z. Y., Yoo, J. W., Kim, W. C., Oh, Y. K.Volume:
60
Language:
english
Journal:
Fusion Science and Technology
DOI:
10.13182/FST60-501
Date:
August, 2011
File:
PDF, 656 KB
english, 2011