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Morphological Evolution of Te and Bi 2 Te 3 Microstructures during Galvanic Displacement of Electrodeposited Co Thin Films
Suh, Hoyoung, Noh, Jinseong, Lee, Ji-Hyun, Lee, Seok-Hoon, Myung, Nosang V., Hong, Kimin, Kim, Jin-GyuLanguage:
english
Journal:
Electrochimica Acta
DOI:
10.1016/j.electacta.2017.09.049
Date:
September, 2017
File:
PDF, 1.29 MB
english, 2017