Development of a New Metric to Identify Rare Patterns in...

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Expert Systems with Applications 2017 / 9

Development of a New Metric to Identify Rare Patterns in Association Analysis: The Case of Analyzing Diabetes Complications

Piri, Saeed, Delen, Dursun, Liu, Tieming, Paiva, William
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Language:
english
Journal:
Expert Systems with Applications
DOI:
10.1016/j.eswa.2017.09.061
Date:
September, 2017
File:
PDF, 8.68 MB
english, 2017
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